CEO-2D-NIR-V
two dimensional imaging spectrograph for arbitrary applications
of ultrashort pulse characterization in near-infrared – especially dispersion measurement
by spectrally and spatially resolved interferometry with PhADIM-D
CEO-2D-NIR-V is an ultimate tool in any ultrafast
NIR laser laboratory. Designed for spectrally and spatially
resolved interferometry (SSRI), this spectrograph is
capable to measure angular and material dispersion with extreme
high accuracy (with the additional use of PhADIM-D).
They are also compatible with conventional pulse characterization
techniques, like FROG and SEA-SPIDER; and beyond that,
they open a way to unlimited experimental applications.
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CEO-2D-NIR-V offers a variable wavelength range, which is inevitable
when accurate spectral measurements needed for pulses with diverse
bandwidths. Our device can be switched easily between three different
wavelength ranges. It is also equipped with two different detectors,
one covers the spectral range between 900-1700 nm well, while the other offers
high sensitivity around 1500 nm.
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Specifications:
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with detector A
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with detector B
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Wavelength range:
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900-1700 nm
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1460-1625 nm
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Spectral sensivity:
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300 µW/cm2 @ 1310 nm
20 mW/cm2 @ 1550 nm
80 mW/cm2 @ 1700 nm
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less than 5 µW/cm2 @ 1550 nm
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Wavelength range span:
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113 / 38 / 22 nm
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81 / 27 / 16 nm
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Spectral resolution:
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0.09/ 0.03 / 0.02 nm
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0.11/ 0.036 / 0.022 nm
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Spatial range:
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6.4 / 9.6 / 12.8 mm
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4.8 / 7.3 /9.7 mm
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Spatial resolution:
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6.3 / 9.4 / 12.5 µm
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8.3 / 12.5 / 16.6 µm
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Detector type:
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CMOS
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CMOS with phosphor layer
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Detector resolution:
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1280 x 1024
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752 x 582
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Conencetion:
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USB 2.0
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Analog converted to USB
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Triggerable:
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no
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no
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A basic software is provided to capture images in various formats (ascii, bmp, tiff, png, jpg).
Dimensions in mm (LxWxH): 355x210x100.
Accessories (optional):
- FRINGER software for evaluation of SSRI interferograms
- PhADIM-S for SSRI dispersion measurements
- MePS, high accuracy beam rotator for 2D charactersiation of the beam.
